Please note that the program is published in Central European Summer Time (CEST).
Characterization techniques have been fundamental for many discoveries in materials science. This Topic focuses on novel characterization techniques, including all forms of microscopy (light, electron, acoustic, etc.), diffraction and spectroscopy with all sorts of probes such as electrons, ions, photons and neutrons, and techniques accessing the bulk, surfaces and interfaces. Developments in both this wide range of techniques and their application to the quantification of the microstructure of materials are addressed.