The development of aberration corrected electron optics, monochromators and sensitive high-speed detectors has revolutionized the characterization of complex materials. In the transmission electron microscope (TEM), the atomic structure, composition, bonding, 3D structure and morphology as well as the response of materials under different stimuli can be explored in a single instrument. The rapid development of novel techniques and hardware capabilities is continuously pushing the boundaries of TEM. The aim of the proposed symposium is to bring together experts with a background in technique development with specialists who characterize advanced materials by TEM.
The focus lies on emerging techniques related to aberration corrected atomic resolution imaging, advances in spectroscopic techniques such as energy dispersive X-ray spectroscopy, electron energy loss spectroscopy, or cathodoluminescence spectroscopy, progress in the development of electron tomography, 4D-STEM techniques as well as in-situ TEM. We also welcome contributions applying those techniques to emerging structural and functional materials, including metals and alloys, nanoparticle systems, multilayer structures, novel semiconductors, ceramics or amorphous materials. Special attention will be paid to contributions developing new computational approaches in electron microscopy and advances of data analysis capabilities. The correlation and combination of TEM with other characterization methods will also be considered.