The investigation of the origin and formation of material microstructures during processing and the effect that microstructure has on the properties of materials are questions of central importance in materials science and engineering. This topic covers symposia for presenting and discussing recent developments in this field, which focus on advancements of characterization techniques and its application in the macro, micro, nano as well as atomic scale of all kinds of materials. Advances in characterization nowadays often mean the explicit consideration of the 3D nature of microstructures. In addition to this, in-situ characterization and in operando techniques are becoming increasingly important. And finally, high throughput characterization is growing more and more powerful. Often successful symposia in this field have an interdisciplinary character and are very welcome.       

Topic Coordinators

Nik Chawla
Arizona State University, USA

Frank Mücklich
Univerität des Saarlandes, Germany

Martina Zimmermann
TU Dresden, Germany


This symposium focuses on electron microscopy (SEM / TEM) and atom probe tomography (APT) to unravel the three-dimensional nature of complex materials. The aim of the symposium is to bring together researchers with a background in electron microscopy and/or atom probe tomography to establish a common ground for future method and technique development. Besides scientific results, also practical aspects, such as improving specimen yield in the atom probe part of the experiment, or innovative experimental setups will be a topic. Techniques being newly developed or under development pushing the limits of 3D characterization that have high potential to be used in correlative EM/APT applications are welcome. Contributions were a direct correlation of electron microscopy and atom probe tomography are successfully applied are preferred.

Symposium Organizers

Christian Liebscher - Max-Planck-Institut für Eisenforschung GmbH, Structure and Micro-/Nanomechanics of Materials, Germany
Michael Herbig - Max-Planck-Institut für Eisenforschung GmbH, Materials science of mechanical contacts, Germany
Sophie Primig - UNSW Sydney, School of Materials Science and Engineering, Australia
Peter Ercius - University of California, National Center for Electron Microscopy, USA
Williams Lefebvre - University of Rouen, Department of Physics, France

The drastic increase in 3D computer processing power and level of automation has moved 3D characterisation into the spotlight in materials science. Various techniques, spanning in resolution from single-atom to large volumes, meters in size, are now allowing to comprehensively image materials across the length scales. This creates a nexus with a broader trend in engineering; the extensive use of 3D simulations for product design. In such 3D simulations, beyond the classical ‘material property’ as a numerical value, true volume properties of inhomogeneous and anisotropic materials can be incorporated. This however demands both the availability and validated approaches of treatment and formatting of such volume data.

In this symposium, we will gather both the 3D characterisation community and the 3D simulation community around the common goal of connecting the two spheres. We hope that it will allow the 3D materials characterisation community to get an up-to-date insight into the needs of those utilising the data and show the simulation community what the most recent additions to the 3D characterisation toolbox are.

Symposium Organizers

Peter Felfer - Friedrich-Alexander Universität Erlangen-Nürnberg, General Materials Properties, Germany
ChristianKübel - Karlsruhe Institute of Technology, Electron Microscopy and Spectroscopy Laboratory, Germany
Frank Mücklich - Universität des Saarlandes, Institute of Functional Materials, Germany
Michael Engstler - Universität des Saarlandes, Institute of Functional Materials, Germany
Dominik Britz - Universität des Saarlandes, Institute of Functional Materials, Germany

Bulk imaging methods provide insight into heterogeneous materials and engineering components. In combination with tomography they yield a fully three-dimensional virtual representation of the internal architecture of materials and structures. Using X-rays and neutrons, hidden structures can be revealed in a non-destructive manner. In addition, multi-modal imaging techniques, time-resolved imaging and hierarchical multi-scale studies are rapidly gaining importance as the systems under study become increasingly complex. The aim of the symposium is to provide an exchange information platform between researchers involved in the rapidly developing experimental techniques and users applying these techniques in the field of materials science and engineering.  Contributions dealing with tomography and radiography using synchrotron and neutron sources will be presented focusing on advances on time/spatial resolution as well as on the simultaneous combination of tomography/radiography with other contrast methods.

Symposium Organizers

Alexander Rack - European Synchrotron Radiation Facility, Experiments Division, France
Guillermo Requena - German Aeorspace Center, Institute of Materials Research, Germany

There has been a rapid development of imaging techniques, of both electron microscopy and X-ray techniques, which equip today’s materials scientists with highly advanced tools to probe materials in a multi-modal, multiscale correlated approach. Electron microscopy enables probing microstructures in 2D at even higher resolutions down to the size of atoms along with the combination of different modalities such as EBSD and EDS.  X-ray techniques using both synchrotron and lab x-ray sources enable imaging materials non-destructively and permit the observation of time-dependent (4D) or in-situ behavior of materials subjected external loads or changing physical conditions at 3D resolutions down to the sub-micron to a few tens of nanometers. Recent developments in X-ray techniques have also demonstrated comparative ability to non-destructively conduct grain mapping using diffraction contrast tomography. Researchers now have the ability to use and combine many of these techniques to help understand the origins of, e.g., mechanical properties and understand how the properties are linked to different scales of the microstructure.

This symposium will cover a broad range of topics related to in situ studies of materials science using electron microscopy, X-ray microscopy and synchrotron X-ray techniques. In particular, multimodal characterizations for in situ studies of materials including the development and application of in situ techniques in the study of materials  in operando. The goal of this symposium is to bring together researchers in the materials science community to share the successes and the potentials for in situ multimodal observations using the above mentioned techniques and further aim to correlate with modeling and simulations across materials science disciplines.

Symposium Organizers

Hrishikesh Bale - Carl Zeiss Microscopy, USA
Ruth Schwaiger - Karlsruhe Institute of Technology, Institute for Applied Materials, Germany
Timo Bernthaler - Hochschule Aalen, Germany

Small-scale and in situ mechanical testing techniques are essential for characterizing and understanding the mechanical behavior of a wide variety of materials. There is a rapid development of innovative in situ and small-scale testing techniques, which allow further insights into the acting deformation processes and dominating deformation mechanisms.
This symposium will mainly focus on both the development of new advanced in situ testing techniques and the further application of these techniques to understand the mechanical behavior of materials. Of particular interest are combined experimental, and simulation approaches. Topics of interest include but are not limited to:

  • Testing and understanding of the deformation behavior of interfaces 
  • Monotonic and cyclic testing combined with interrupted monitoring 
  • Testing at elevated temperatures and under various environmental conditions
  • Fracture toughness testing
  • Correlation high-resolution microscopy analysis and in situ testing 
  • Evaluation of localized phenomena by use of digital image correlation, acoustic and thermal measurements or combined full-field measurements

Symposium Organizers

Karsten Durst - Darmstadt University of Technology, Physical Metallurgy, Germany
Verena Maier-Kiener - Montan Universität, Department Physical Metallurgy and Materials Testing, Austria
Rebecca Janisch - Ruhr-Universität Bochum, Interdisciplinary Centre for Advanced Materials Simulation, Germany
Afrooz Barnoush - Norwegian University of Science and Technology, Department of Mechanical and Industrial Engineering, Norway

Surfaces and atomically thin layers have properties different from those of the material volume and these specific qualities are of utmost importance to applications and function of materials or even whole devices. This applies, for example, to topics like wettability, adhesion, corrosion, catalysis and many others. Surface analytical methods like electron spectroscopy and mass spectrometry, provide surface sensitive information on the chemical and structural composition of interfaces and surfaces. The focus of the symposium will be placed on new instrumental and methodical developments in the field and the potential that such methods offer to optimize material properties and to investigate fundamental and technological processes at surfaces.

Symposium Organizers

Michael Kopnarski - Technische Universität Kaiserslautern, Institute for Surface and Thin Film Analysis, Germany
Tom Wirtz - Luxembourg Institute of Science and Technology, Department Materials Research and Technology, Luxembourg
Jens Kreisel - Luxembourg Institute of Science and Technology, Department Materials Research and Technology, Luxembourg

Since the advent of Electron Back Scattering Diffraction (EBSD) a large number of characterization techniques have been introduced taking advantage of previously existent scientific concepts and gadgets. Transmission Kikuchi Diffraction (TKD), Precession Electron Diffraction TEM based (PED-TEM) and Electron Channeling Contrast Imaging (ECCI) techniques are among the most advanced ones, together with recent slowly spreading 3D versions. The advent and continuous improvement of High-Resolution EBSD, both spatial and orientational, have open a new field on characterization. All together conform a set of very powerful approaches for microstructure characterization.
A collective analysis of pros and cons, strengths and weaknesses of Orientation Imaging Techniques would contribute to the better understanding of their cross-breeding origins, capabilities and future developments. 
The topics of the current symposium includes recent developments, experience exchange on measuring and interpretation and proposal of future improvements and technique interactions. All fields of applications (biomaterials, metals, ceramics, geology, etc.) are welcome.

Symposium Organizers

Stefan Zaefferer - Max-Planck-Institut für Eisenhüttenforschung GmbH, Department Microstructure Physics and Alloy Design, Germany
Martina Avalos - National Scientific and Technical Research Council, Argentina
Raúl Bolmaro - National Scientific and Technical Research Council, Argentina

The DNA of materials is their microstructure which determines properties and behavior. Today's key challenges for tailoring and utilizing the structure-property relation consists in characterizing microstructures, introducing suitable digital formats and tools, and developing new methodologies and data analysis approaches to couple experiment and simulation throughout the whole materials life cycle.

This symposium aims to attract the following contributions:

  • automated 3D/4D characterization across the scales,
  • in-situ/in-line characterization of microstructural evolution, fast sensor analytics with black- and graybox approaches,
  • microstructure ontology, work flows, open data standards and tools,
  • data fusion, machine learning, digital exchange platforms and data bases,
  • 3D/4D visualization,
  • microstructure based real time assessment and simulation of properties, 
  • behavior and lifetime prediction,
  • microstructure and defect evolution in production and service: e.g. acquisition of multiaxial deformation, simulations of impact of microstructural evolution on lifetime.

Symposium Organizers

Hans-Georg Herrmann - Fraunhofer Institute for Nondestructive Testing , Germany
Christoph Eberl - Fraunhofer Institute for Mechanics of Materials, Germany
Stefan Sandfeld - TU Bergakademie Freiberg, Micromechanical Materials Modelling, Germany
Babtiste Gault - Max-Planck-Institut für Eisenhüttenforschung GmbH, Atom Probe Tomography, Germany

In order to fully exploit the property potentials of modern structural materials (thermo-) mechanical processing becomes necessary. During operation, the material in a structural component experiences another mechanical and/or thermal loading. A reliable prediction of a components integrity significantly relies on a profound knowledge of the microstructural evolution and likely damage mechanisms under any such processing and load history.

The characterization of the microstructural evolution implies a close experimental setup of modern analytical tools as well as the realization of processing and deformation under well-defined laboratory conditions – ranging from small-scale samples up to full-scale component testing and analysis. The major areas to be covered in this symposium are all aspects of the fundamentals, synthesis, analysis, monitoring and control of microstructural evolution, damage mechanisms and failure under mechanical and thermo-mechanical processing and deformation, also including innovative failure analysis techniques; models for real-time process control and quality monitoring systems.

Symposium Organizers

Martina Zimmermann - TU Dresden, Faculty of Mechanical Science and Engineering, Germany
Jens Freudenberger - Leibniz Institute for Solid State and Materials Research, Deparment of Metal Physics, Germany
James E. Martinez - NASA, Johnson Space Center, USA

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